Invention Grant
- Patent Title: Detection device and detection method
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Application No.: US16064349Application Date: 2016-08-10
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Publication No.: US10704900B2Publication Date: 2020-07-07
- Inventor: Megumi Irie
- Applicant: MITSUBISHI ELECTRIC CORPORATION
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@59b4c931
- International Application: PCT/JP2016/073615 WO 20160810
- International Announcement: WO2017/119154 WO 20170713
- Main IPC: G01B11/30
- IPC: G01B11/30 ; G06T1/00 ; G01N21/954 ; G01N21/88 ; G06T7/00 ; G01S13/88 ; G06T1/60

Abstract:
A detection device includes: a crack detection unit to detect a deformation on a surface of a structure from image information on the structure; a step detection unit to detect a step on the surface of the structure from three-dimensional point group information on the structure measured with a laser; and a determination unit to determine a state of the deformation using information on the deformation generated by the crack detection unit and information on the step generated by the step detection unit.
Public/Granted literature
- US20190003830A1 DETECTION DEVICE AND DETECTION METHOD Public/Granted day:2019-01-03
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