Invention Grant
- Patent Title: Surface defect detecting method and surface defect detecting apparatus
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Application No.: US16112939Application Date: 2018-08-27
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Publication No.: US10705027B2Publication Date: 2020-07-07
- Inventor: Hiroaki Ono , Toshifumi Kodama , Takahiro Koshihara , Akihiro Ogawa , Yukinori Iizuka
- Applicant: JFE Steel Corporation
- Applicant Address: JP Tokyo
- Assignee: JFE Steel Corporation
- Current Assignee: JFE Steel Corporation
- Current Assignee Address: JP Tokyo
- Agency: DLA Piper LLP (US)
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1b69c7ad com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5376b570 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@444a752e
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/892 ; G01N21/952 ; G01B11/245 ; G06T7/70 ; G06K9/46 ; G06K9/62 ; G06T7/00 ; H04N7/01

Abstract:
A detecting method of optically detecting a surface defect of a moving steel material includes an irradiation step of irradiating an examination target part with illumination light beams from different directions by two or more distinguishable light sources whose light emission durations are set based on at least an allowable positional displacement of an image, the two or more distinguishable light sources repeatedly emitting light such that their light emission timings thereof do not overlap each other; and a detection step of obtaining images by reflected light beams of the respective illumination light beams and detecting a surface defect in the examination target part by executing subtraction processing between the obtained images.
Public/Granted literature
- US20190011375A1 SURFACE DEFECT DETECTING METHOD AND SURFACE DEFECT DETECTING APPARATUS Public/Granted day:2019-01-10
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