Invention Grant
- Patent Title: Sample handling apparatus for pressurized fluids and X-ray analyzer applications thereof
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Application No.: US16085306Application Date: 2017-03-13
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Publication No.: US10705033B2Publication Date: 2020-07-07
- Inventor: Joseph J Spinazola, III , Jay Burdett , Zewu Chen , Daniel Dunham
- Applicant: X-RAY OPTICAL SYSTEMS, INC.
- Applicant Address: US NY East Greenbush
- Assignee: X-RAY OPTICAL SYSTEMS, INC.
- Current Assignee: X-RAY OPTICAL SYSTEMS, INC.
- Current Assignee Address: US NY East Greenbush
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Kevin P. Radigan, Esq.
- International Application: PCT/US2017/022077 WO 20170313
- International Announcement: WO2017/160705 WO 20170921
- Main IPC: G01N23/2204
- IPC: G01N23/2204 ; G01N23/20041 ; G01N23/223

Abstract:
A sample handling apparatus/technique/method for a material analyze including a sample carrier for presenting a pressurized sample (e.g., LPG) to a sample focal area of the analyzer; a removable fixture for charging the pressurized sample into the sample carrier; the removable fixture including at least one port to provide sample to and from the fixture and carrier. The sample handling apparatus may include a retainer, wherein the sample carrier is removeably combined with the fixture using the retainer, the apparatus being insertable into the analyzer for sample analysis; and wherein the retainer includes an aperture for presenting the sample to the focal area from a filmed, lower end of the carrier in proximity therewith.
Public/Granted literature
- US20190056337A1 SAMPLE HANDLING APPARATUS FOR PRESSURIZED FLUIDS AND X-RAY ANALYZER APPLICATIONS THEREOF Public/Granted day:2019-02-21
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