Invention Grant
- Patent Title: Probe assembly and probe structure thereof
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Application No.: US16154846Application Date: 2018-10-09
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Publication No.: US10705117B2Publication Date: 2020-07-07
- Inventor: Wen-Tsung Lee , Kai-Chieh Hsieh , Yuan-Chiang Teng
- Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Applicant Address: TW Taoyuan
- Assignee: CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Current Assignee: CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Current Assignee Address: TW Taoyuan
- Agency: Li & Cai Intellectual Property (USA) Office
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@13ae7373
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R1/073 ; H01L21/00
Abstract:
A probe component and a probe structure thereof are provided. The probe structure includes a first contacting segment, a first connecting segment, a second connecting segment and a second contacting segment. The first contacting segment has an abutting portion and a first end portion connected to the abutting portion. The first connecting segment is connected to the first contacting segment. The second connecting segment is connected to the first connecting segment. The second contacting segment is connected to the second connecting segment and has a second end portion.
Public/Granted literature
- US20190265274A1 PROBE ASSEMBLY AND PROBE STRUCTURE THEREOF Public/Granted day:2019-08-29
Information query
