Invention Grant
- Patent Title: Techniques for testing PLP capacitors
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Application No.: US15703664Application Date: 2017-09-13
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Publication No.: US10705129B2Publication Date: 2020-07-07
- Inventor: Paul Abrahams , Ilya Shlimenzon
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Tokyo
- Assignee: Toshiba Memory Corporation
- Current Assignee: Toshiba Memory Corporation
- Current Assignee Address: JP Tokyo
- Agency: White & Case LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G01R27/26 ; G11C5/14 ; G11C29/02 ; G11C29/50 ; H01G11/12 ; H02J7/00 ; G01R21/00 ; G01R31/30 ; G06F1/30 ; G01R31/64

Abstract:
A solid state drive (SSD) with improved techniques for testing power loss protection (PLP) capacitors and a method for testing PLP capacitors of SSDs is disclosed. In one embodiment, the SSD includes a memory controller and one or more non-volatile memory devices and a volatile memory device coupled to the memory controller. The SSD also includes a PLP capacitor configured to supply a first voltage to the memory controller, the one or more non-volatile memory devices, and the volatile memory device in the event of a power loss or failure of the SSD. In one embodiment, the PLP capacitor is further configured to increase the first voltage to a second voltage prior to testing the PLP capacitor. In another embodiment, the memory controller is configured to reduce a volume of data stored in the volatile memory device prior to testing the PLP capacitor.
Public/Granted literature
- US20190079125A1 Techniques for Testing PLP Capacitors Public/Granted day:2019-03-14
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