Invention Grant
- Patent Title: Nondestructive inspection system
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Application No.: US16256066Application Date: 2019-01-24
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Publication No.: US10705243B2Publication Date: 2020-07-07
- Inventor: Byeongno Lee , Soomin Lee , Namho Lee , Moonsik Chae , Jungho Mun , Kyungmin Oh , Changgoo Kang , Hansoo Kim
- Applicant: KOREA ATOMIC ENERGY RESEARCH INSTITUTE
- Applicant Address: KR Daejeon
- Assignee: KOREA ATOMIC ENERGY RESEARCH INSTITUTE
- Current Assignee: KOREA ATOMIC ENERGY RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Agency: Scully Scott Murphy and Presser
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@61f99fbd com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@62fd312b
- Main IPC: G01V5/00
- IPC: G01V5/00 ; G01N23/223 ; G01N23/2251 ; G01N23/2208

Abstract:
Disclosed is a nondestructive inspection system includes: a radiation source system generating different types of radiations and irradiating the generated different types of radiations toward an inspection object; a detector system detecting each of the radiations transmitted through the inspection object; a transfer system varying a position of the inspection object such that the radiations generated by the radiation source system are irradiated to the inspection object; and an image system generating an image regarding the inspection object on the basis of a detection result from the detector system, wherein the radiation source system comprises: an electron gun generating an electron beam; an electron accelerator accelerating the electron beam generated by the electron gun; and a target system selectively generating at least one of various types of radiations according to variables when the electron beam accelerated by the electron accelerator is irradiated thereto.
Public/Granted literature
- US20190235124A1 NONDESTRUCTIVE INSPECTION SYSTEM Public/Granted day:2019-08-01
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