Invention Grant
- Patent Title: Focusing method, measuring method, principal point detecting method, focusing device, measuring device, and principal point detecting device
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Application No.: US15240384Application Date: 2016-08-18
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Publication No.: US10705325B2Publication Date: 2020-07-07
- Inventor: Yoshimasa Suzuki , Kazuo Kajitani
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5fa13dc0
- Main IPC: G02B21/06
- IPC: G02B21/06 ; G02B21/00 ; G02B21/24 ; G02B7/28 ; G02B21/08 ; G02B21/34

Abstract:
A focusing method includes a step of preparing a microscope, a step of mounting a sample, and a predetermined processing step, the predetermined processing step includes a step of receiving light emitted from the observation optical system, a step of obtaining the quantity of light based on light from a predetermined region of the received light, a step of calculating a difference or a ratio between the quantity of light in the predetermined region and the quantity of light as a reference, a step of comparing a calculation result with a threshold, and a step of changing the distance between the sample and the observation optical system, and in the step of preparing, a partial region of illumination light is shielded or darkened, and when the result of the calculation is equal to or smaller than the threshold, the predetermined processing step is terminated.
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