Invention Grant
- Patent Title: Analog circuit fault mode classification method
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Application No.: US15555077Application Date: 2015-11-24
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Publication No.: US10706332B2Publication Date: 2020-07-07
- Inventor: Lifen Yuan , Shuai Luo , Yigang He , Peng Chen , Chaolong Zhang , Ying Long , Zhen Cheng , Zhijie Yuan , Deqin Zhao
- Applicant: HEFEI UNIVERSITY OF TECHNOLOGY
- Applicant Address: CN Anhui
- Assignee: HEFEI UNIVERSITY OF TECHNOLOGY
- Current Assignee: HEFEI UNIVERSITY OF TECHNOLOGY
- Current Assignee Address: CN Anhui
- Agency: JCIPRNET
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7efd936b
- International Application: PCT/CN2015/095424 WO 20151124
- International Announcement: WO2017/024691 WO 20170216
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G01R31/316 ; G06K9/00 ; G06K9/03

Abstract:
An analog circuit fault mode classification method comprises the following implementation steps: (1) collecting M groups of voltage signal sample vectors Vij to each of fault modes Fi of the analog circuit by using a data collection board; (2) sequentially extracting fault characteristic vectors VijF of the voltage signal sample vectors Vij by using subspace projection; (3) standardizing the extracted fault characteristic vectors VijF to obtain standardized fault characteristic vectors; (4) constructing a fault mode classifier based on a support vector machine, inputting the standardized fault characteristic vectors, performing learning and training on the classifier, and determining structure parameters of the classifier; and (5) completing determination of fault modes according to fault mode determination rules. The fault mode classifier of the present invention is simple in learning and training and reliable in mode classification accuracy.
Public/Granted literature
- US20180039865A1 ANALOG CIRCUIT FAULT MODE CLASSIFICATION METHOD Public/Granted day:2018-02-08
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