Invention Grant
- Patent Title: Image quality index and/or imaging parameter recommendation based thereon
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Application No.: US14782727Application Date: 2014-04-03
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Publication No.: US10706506B2Publication Date: 2020-07-07
- Inventor: Amar Dhanantwari , Dhruv Mehta , Yael Nae
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- Agent Larry Liberchuk
- International Application: PCT/IB2014/060401 WO 20140403
- International Announcement: WO2014/167463 WO 20141016
- Main IPC: G06T5/00
- IPC: G06T5/00 ; G06T11/00 ; A61B6/00

Abstract:
A method includes determining a low contrast detectability of a scan and generating an image quality index based on the determined low contrast detectability. Another method includes identifying an image quality index of interest, identifying an acquisition and/or reconstruction parameter based on the image quality index and a pre-determined mapping between image quality indexes and acquisition parameter and reconstruction parameters, and displaying the identified acquisition and/or the reconstruction parameter. A system (100) includes a metric determiner (122) that determines a first image quality index for a scan based on at least one of a low contrast detectability of the scan or a project domain noise of the scan, and/or a parameter recommender (126) that recommends at least one of an acquisition or a reconstruction parameter for a scan based on a second image quality index, and a display (114) that visually presents the first or second image quality index.
Public/Granted literature
- US20160042499A1 IMAGE QUALITY INDEX AND/OR IMAGING PARAMETER RECOMMENDATION BASED THEREON Public/Granted day:2016-02-11
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