Invention Grant
- Patent Title: Inspection method
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Application No.: US14232480Application Date: 2012-07-13
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Publication No.: US10706521B2Publication Date: 2020-07-07
- Inventor: Soo-Young Cho
- Applicant: Soo-Young Cho
- Applicant Address: KR Seoul
- Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee Address: KR Seoul
- Agency: Kile Park Reed & Houtteman PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@73559f56
- International Application: PCT/KR2012/005636 WO 20120713
- International Announcement: WO2013/009151 WO 20130117
- Main IPC: G01B9/00
- IPC: G01B9/00 ; G01B11/00 ; G06T7/00 ; G01N21/956 ; H04N5/225

Abstract:
To inspect a board, first, a measurement area is set on the board and a reference data of the measurement area is obtained. Then, a measurement data of the measurement area is obtained per colors, and a lighting condition is set using the reference data of the measurement area and the measurement data obtained per colors. Next, a feature object in the measurement area is set, and a distortion quantity between the reference data and the measurement data is obtained by comparing the reference data corresponding to the feature object and the measurement data corresponding to the feature object obtained under the lighting condition. Then, an inspection area is set by compensating the distortion quantity. Therefore, it is possible to compensate the distortion and set precisely the inspection area.
Public/Granted literature
- US20140168419A1 INSPECTION METHOD Public/Granted day:2014-06-19
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