Invention Grant
- Patent Title: Methods and systems for improved quality inspection
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Application No.: US15986699Application Date: 2018-05-22
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Publication No.: US10706525B2Publication Date: 2020-07-07
- Inventor: Liang Diao , Haisong Gu , Tao Liu
- Applicant: MIDEA GROUP CO., LTD.
- Applicant Address: CN Foshan
- Assignee: MIDEA GROUP CO. LTD.
- Current Assignee: MIDEA GROUP CO. LTD.
- Current Assignee Address: CN Foshan
- Agency: Morgan, Lewis & Bockius LLP
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06K9/62 ; G06T7/11

Abstract:
A method of performing automated object inspection includes obtaining a plurality of test images. For each of the plurality of test images, the method includes performing independent object inspection on each of two or more sub-portions of the test image. The method further includes segmenting the test image into at least a first sub-portion of the test image and a second sub-portion of the test image; performing object inspection on the first sub-portion of the test image using a first subset of information channels of the test image and a first model trained on a first set of training images containing the first component; and performing object inspection on the second sub-portion of the test image using a second subset of information channels of the test image, and a second model trained on a second set of training images containing the second component.
Public/Granted literature
- US20190362486A1 METHODS AND SYSTEMS FOR IMPROVED QUALITY INSPECTION Public/Granted day:2019-11-28
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