Refresh control circuit, semiconductor memory device, and refresh method thereof
Abstract:
A semiconductor memory device includes: first to Nth memory banks each including a normal cell region coupled to normal word lines and a redundant cell region coupled to redundant word lines; first to Nth non-volatile memories that correspond to the first to Nth memory banks, respectively, each including a plurality of memory sets for programming repair addresses of the corresponding memory banks; a refresh control circuit for generating first to Nth count values by counting a number of the memory sets used in the first to Nth non-volatile memories, and generating a redundant reset signal based on the first to Nth count values; and an address generation circuit for sequentially generating normal addresses for selecting the normal word lines and redundant addresses for selecting the redundant word lines based on a refresh signal, and initializing the redundant addresses based on the redundant reset signal.
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