Invention Grant
- Patent Title: Photomask pellicle glue residue removal
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Application No.: US16443341Application Date: 2019-06-17
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Publication No.: US10710358B2Publication Date: 2020-07-14
- Inventor: Banqiu Wu , Eli Dagan
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan, LLP
- Main IPC: H01L21/027
- IPC: H01L21/027 ; G03F7/20 ; B41C1/10

Abstract:
Embodiments described herein generally relate to an apparatus and methods for removing a glue residue from a photomask. The glue residue may be exposed when a pellicle is removed from the photomask. Before a new pellicle can be adhered to the photomask, the glue residue may be removed. To remove the glue residue, a laser beam may be projected through a lens and focused on a surface of the glue residue. The glue residue may be ablated from the photomask by the laser beam.
Public/Granted literature
- US20200009854A1 PHOTOMASK PELLICLE GLUE RESIDUE REMOVAL Public/Granted day:2020-01-09
Information query
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