Invention Grant
- Patent Title: Inspection spot output apparatus, control method, and storage medium
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Application No.: US15759560Application Date: 2016-09-07
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Publication No.: US10713488B2Publication Date: 2020-07-14
- Inventor: Yoshinori Saida , Shin Norieda , Makoto Yoshimoto , Kota Iwamoto , Takami Sato , Ruihan Bao
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1fd8279b
- International Application: PCT/JP2016/076249 WO 20160907
- International Announcement: WO2017/081920 WO 20170518
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06F3/147 ; G06Q10/00 ; G06T19/00 ; G02B27/01 ; G06F3/14

Abstract:
An image acquisition unit (2020) acquires a captured image containing an inspection target instrument. An inspection information acquisition unit (2040) acquires inspection information regarding the instrument contained in the captured image. The inspection information is information indicating an inspection item of the instrument. A first display control unit (2060) displays an indication representing an inspection spot corresponding to the inspection item indicated by the inspection information on the display device (10). For example, the first display control unit (2060) displays the indication representing the inspection spot so that the indication is superimposed on the inspection spot on a display device (10). For example, the first display control unit (2060) displays the indication in the inspection spot on the display device (10) or near the instrument.
Public/Granted literature
- US20190156118A1 INFORMATION PROCESSING APPARATUS, CONTROL METHOD, AND PROGRAM Public/Granted day:2019-05-23
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