Invention Grant
- Patent Title: Analysis apparatus and analysis method
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Application No.: US16444150Application Date: 2019-06-18
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Publication No.: US10713770B2Publication Date: 2020-07-14
- Inventor: Yasuo Namioka , Nobuaki Takahashi , Hideki Yasui , Masaya Motokubota , Yuki Yatsushima
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Minato-ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@276a6ab3
- Main IPC: G06F3/01
- IPC: G06F3/01 ; G06F3/0346 ; G06K9/00 ; G06K9/52 ; G06K9/62 ; G06Q10/06 ; G06Q10/10 ; G06T7/00

Abstract:
According to one embodiment, an analysis apparatus includes an acquisition unit and a processor. The acquisition unit acquires first information with a first time length between a first time and a second time. The first information is based on motion of an object person. The processor extracts multiple similarity points from the first information. The multiple similarity points are similar to each other in the first information. The processor calculates a time interval between the similarity points.
Public/Granted literature
- US20190304083A1 ANALYSIS APPARATUS AND ANALYSIS METHOD Public/Granted day:2019-10-03
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