Invention Grant
- Patent Title: Inspecting method of light emitting diode and apparatus for inspecting the same
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Application No.: US16044904Application Date: 2018-07-25
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Publication No.: US10713985B2Publication Date: 2020-07-14
- Inventor: Sungbae Ju
- Applicant: SAMSUNG DISPLAY CO., LTD.
- Applicant Address: KR Yongin-si, Gyeonggi-Do
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5d5f60e
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G09G3/00 ; G01N21/956 ; G01N21/88 ; G01J1/42

Abstract:
A method of inspecting light emitting elements includes disposing a first electrode and a second electrode on a substrate. A solution including a plurality of light emitting elements is applied on the first electrode and the second electrode. A first voltage is applied across the first electrode and the second electrode so as to cause the plurality of light emitting elements to emit light. The light emitted from the plurality of light emitting elements is photographed and first image data is generated therefrom. A density of the plurality of light emitting elements is determined using the first image data.
Public/Granted literature
- US20190180661A1 INSPECTING METHOD OF LIGHT EMITTING DIODE AND APPARATUS FOR INSPECTING THE SAME Public/Granted day:2019-06-13
Information query