Invention Grant
- Patent Title: Methods for determining data states of memory cells
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Application No.: US16152897Application Date: 2018-10-05
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Publication No.: US10714196B2Publication Date: 2020-07-14
- Inventor: Tommaso Vali , Ramin Ghodsi
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/34 ; G11C16/26 ; G11C16/08 ; G11C16/32

Abstract:
Methods of operating a memory might include sensing a state of each data line of a plurality of data lines while increasing a voltage level applied to each access line of a plurality of access lines commonly connected to a plurality of strings of series-connected memory cells, determining a particular voltage level at which the state of each data line of a first subset of the plurality of data lines has changed, decreasing a voltage level applied to a particular access line of the plurality of access lines, and sensing a state of each data line of a second subset of the plurality of data lines while applying the particular voltage level to the particular access line. Methods of operating a memory might further include determining a pass voltage and plurality of read voltages for a read operation during a precharge phase of the read operation, applying the pass voltage to each unselected access line of a plurality of access lines, and, for each read voltage of the plurality of read voltages, applying that read voltage to a selected access line of the plurality of access lines and sensing a data state of a memory cell connected to the selected access line.
Public/Granted literature
- US20200111534A1 METHODS FOR DETERMINING DATA STATES OF MEMORY CELLS Public/Granted day:2020-04-09
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