Invention Grant
- Patent Title: Semiconductor device having metal bump and method of manufacturing the same
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Application No.: US16151724Application Date: 2018-10-04
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Publication No.: US10714438B2Publication Date: 2020-07-14
- Inventor: Jinchan Ahn , Won-young Kim , Chanho Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F.Chau & Associates, LLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6ba2c793
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L23/522

Abstract:
Provided are a semiconductor device and a method of manufacturing the same. The semiconductor device includes a metal line layer on a semiconductor substrate, and a metal terminal on the metal line layer. The metal line layer includes metal lines, and a passivation layer having a non-planarized top surface including flat surfaces on the metal lines and a concave surface between the metal lines. The metal terminal is provided on the passivation layer. Opposite lateral surfaces of the metal terminal facing each other are provided on the flat surfaces of the passivation layer.
Public/Granted literature
- US20190206816A1 SEMICONDUCTOR DEVICE HAVING METAL BUMP AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2019-07-04
Information query
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