Invention Grant
- Patent Title: Print quality examination device
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Application No.: US16315446Application Date: 2017-07-12
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Publication No.: US10717269B2Publication Date: 2020-07-21
- Inventor: Hiromitsu Numauchi , Takashi Suto , Sayuri Yanagiuchi , Ryuzo Tanigawa
- Applicant: KOMORI CORPORATION , GLORY LTD.
- Applicant Address: JP Tokyo JP Hyogo
- Assignee: KOMORI CORPORATION,GLORY LTD.
- Current Assignee: KOMORI CORPORATION,GLORY LTD.
- Current Assignee Address: JP Tokyo JP Hyogo
- Agency: Birch Stewart Kolasch & Birch LLP.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2e5a7f7a
- International Application: PCT/JP2017/025344 WO 20170712
- International Announcement: WO2018/012518 WO 20180118
- Main IPC: G01N21/86
- IPC: G01N21/86 ; B41F33/00 ; B41M3/14 ; G01N21/88 ; B41F13/00

Abstract:
A print quality examination device is provided in a printing machine (1) provided with a printing unit (3) that performs printing on a mirror-reflection member (5a) of a sheet (5) to which the mirror-reflection member (5a) is added. The print quality examination device of the printing machine is provided with an examination camera (18a) that images a picture printed on the sheet (5), a light source (18h) that irradiates the sheet (5) with light, and a print quality examination unit (18g) that examines the quality of the picture printed by the printing unit (3) based on image data imaged by the examination camera (18a). The examination camera (18a) or the light source (18h) is configured to be movably supported on an arc about a detection point (P) imaged by the examination camera (18a) for the sheet (5).
Public/Granted literature
- US20190224963A1 PRINT QUALITY EXAMINATION DEVICE Public/Granted day:2019-07-25
Information query