Invention Grant
- Patent Title: Spectrometer arrangement, method for producing a two-dimensional spectrum by means of such a spectrometer arrangement
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Application No.: US16225121Application Date: 2018-12-19
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Publication No.: US10718666B2Publication Date: 2020-07-21
- Inventor: Stefan Münch , Michael Okruss
- Applicant: Analytik Jena AG
- Applicant Address: DE Jena
- Assignee: Analytik Jena AG
- Current Assignee: Analytik Jena AG
- Current Assignee Address: DE Jena
- Agency: Endress+Hauser (USA) Holding Inc.
- Agent Christopher R. Powers
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5ed3c061
- Main IPC: G01J3/04
- IPC: G01J3/04 ; G01J3/22 ; G01J3/02 ; G01J3/18 ; G01J3/14 ; G01J3/12

Abstract:
The present disclosure discloses a spectrometer arrangement including an entrance-slit group including a slit wheel and a slit mask for introducing radiation into and for limiting the optical field of the spectrometer arrangement, a first dispersive element for spectrally decomposing the radiation in a main dispersion direction, and a second dispersive element for spectrally decomposing the radiation in a transverse dispersion direction that forms an angle with the main dispersion direction to yield a two-dimensional spectrum. The slit wheel is mounted rotatably about an axis of rotation and has a falcate opening having a width that changes depending on the angle. The slit mask includes an opening that is longer than a largest width of the falcate opening such that radiation radiates through the falcate opening of the slit wheel and the opening of the slit mask. The present disclosure further includes a corresponding method and an optical component group.
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