• Patent Title: System analyzing device, system analyzing method and storage medium
  • Application No.: US15528825
    Application Date: 2015-12-01
  • Publication No.: US10719577B2
    Publication Date: 2020-07-21
  • Inventor: Masanao Natsumeda
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC CORPORATION
  • Current Assignee: NEC CORPORATION
  • Current Assignee Address: JP Tokyo
  • Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@546ded9f com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1ffce394
  • International Application: PCT/JP2015/005967 WO 20151201
  • International Announcement: WO2016/088362 WO 20160609
  • Main IPC: G06F17/18
  • IPC: G06F17/18 G01D9/00 G05B23/02 G06N5/04
System analyzing device, system analyzing method and storage medium
Abstract:
A system analyzing device according to the present invention includes: a collection unit that collects a plurality of pieces of sensor data of a monitored system; a storage unit that stores a correlation modes based on at least one of a plurality of pieces of sensor data; and a standard contribution acquisition unit that acquires, for a predicted value of an objective variable of a regression equation thereof, a standard contribution indicating a ratio of contribution of each of the data included as explanatory variables.
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