- Patent Title: System analyzing device, system analyzing method and storage medium
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Application No.: US15528825Application Date: 2015-12-01
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Publication No.: US10719577B2Publication Date: 2020-07-21
- Inventor: Masanao Natsumeda
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@546ded9f com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1ffce394
- International Application: PCT/JP2015/005967 WO 20151201
- International Announcement: WO2016/088362 WO 20160609
- Main IPC: G06F17/18
- IPC: G06F17/18 ; G01D9/00 ; G05B23/02 ; G06N5/04

Abstract:
A system analyzing device according to the present invention includes: a collection unit that collects a plurality of pieces of sensor data of a monitored system; a storage unit that stores a correlation modes based on at least one of a plurality of pieces of sensor data; and a standard contribution acquisition unit that acquires, for a predicted value of an objective variable of a regression equation thereof, a standard contribution indicating a ratio of contribution of each of the data included as explanatory variables.
Public/Granted literature
- US20170315961A1 SYSTEM ANALYZING DEVICE, SYSTEM ANALYZING METHOD AND STORAGE MEDIUM Public/Granted day:2017-11-02
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