Invention Grant
- Patent Title: Patch monitoring and analysis
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Application No.: US14871921Application Date: 2015-09-30
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Publication No.: US10719608B2Publication Date: 2020-07-21
- Inventor: Seth G. Carpenter , David J. Brummet , Eric T. Boice , Ganesh P. Gadhe
- Applicant: Honeywell International Inc.
- Applicant Address: US NJ Morris Plains
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morris Plains
- Main IPC: G06F21/57
- IPC: G06F21/57 ; G06F8/71 ; G06F8/65

Abstract:
This disclosure provides for patch monitoring and analysis, such as in an industrial process control and automation system. A method includes discovering at least one connected device by a risk manager system, including a software module for the connected device and installed patch information for the software module. The method includes identifying current patch information for the software module by the risk manager system. The method includes populating a patch definition file according to the device, the software module, the installed patch information, the current patch information, by the risk manager system. The method includes analyzing the patch definition file. The method includes producing an output based on the analysis by the risk manager system, the output including the software module, the installed patch information, the current patch information, and the status of the software module with respect to the installed patch information.
Public/Granted literature
- US20160232359A1 PATCH MONITORING AND ANALYSIS Public/Granted day:2016-08-11
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