Disclosed are a process design kit (PDK) for integrated circuit (IC) designs and a computer-aided design (CAD) system that employs the PDK. The PDK includes a design scan script. When the script is executed by the CAD system, previously generated and stored IC designs are scanned and a report with cell use information (CUI) is generated. The CUI indicates the different parameterized cells (pcells) and different configurations thereof contained in the IC designs. Also disclosed is a PDK development system, which receives CUI reports from CAD system(s), compiles the CUI, and revises the PDK (i.e., develops an update or upgrade) based, in part, on the complied CUI. For example, the complied CUI can indicate critical targets that require a regression analysis during the PDK revision process. By limiting regression analyses to identified critical targets, the turn around time and costs associated with revising the PDK are significantly reduced.