- Patent Title: Methods for reading machine-readable labels on sample receptacles
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Application No.: US16208186Application Date: 2018-12-03
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Publication No.: US10719677B2Publication Date: 2020-07-21
- Inventor: Norbert D. Hagen , David Opalsky , Rolf Silbert
- Applicant: GEN-PROBE INCORPORATED
- Applicant Address: US CA San Diego
- Assignee: Gen-Probe Incorporated
- Current Assignee: Gen-Probe Incorporated
- Current Assignee Address: US CA San Diego
- Agent Charles B. Cappellari; Brian S. Sun; Kyle E. Conklin
- Main IPC: G06K7/10
- IPC: G06K7/10 ; G01N35/00 ; G01N35/02 ; G06K7/14 ; G06K19/06 ; G01N35/04

Abstract:
A method of reading machine-readable labels on sample receptacles held by a sample rack. In the method, an absolute position of the sample rack is measured as the sample rack moves between first and second positions in a housing. During movement between the first and second positions, an image is acquired of a machine-readable label associated with each sample receptacle held by the sample rack. The image of each machine-readable label is thereafter decoded.
Public/Granted literature
- US20190311166A1 METHODS FOR READING MACHINE-READABLE LABELS ON SAMPLE RECEPTACLES Public/Granted day:2019-10-10
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