- Patent Title: Method of forming a buried interconnect and the resulting devices
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Application No.: US16240335Application Date: 2019-01-04
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Publication No.: US10720391B1Publication Date: 2020-07-21
- Inventor: Bipul C. Paul , Lars W. Liebmann , Ruilong Xie
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Amerson Law Firm, PLLC
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L23/535 ; H01L21/308 ; H01L21/306 ; H01L21/8234 ; H01L21/768 ; H01L29/06 ; H01L27/088 ; H01L29/08 ; H01L27/11 ; H01L21/02 ; H01L29/66

Abstract:
A method of forming a buried local interconnect is disclosed including, among other things, forming a first sacrificial layer embedded between a first semiconductor layer and a second semiconductor layer, forming a plurality of fin structures above the second semiconductor layer, forming a mask layer having an opening positioned between an adjacent pair of the fin structures, removing a portion of the second semiconductor layer exposed by the opening to expose the first sacrificial layer and define a first cavity in the second semiconductor layer, removing portions of the first sacrificial layer positioned between the first semiconductor layer and the second semiconductor layer to form lateral cavity extensions of the first cavity, forming a first liner layer in the first cavity, and forming a conductive interconnect in the first cavity over the first liner layer.
Public/Granted literature
- US20200219813A1 METHOD OF FORMING A BURIED INTERCONNECT AND THE RESULTING DEVICES Public/Granted day:2020-07-09
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