Invention Grant
- Patent Title: Electronic device and method for testing wireless communication circuit
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Application No.: US16419172Application Date: 2019-05-22
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Publication No.: US10720950B2Publication Date: 2020-07-21
- Inventor: Yongjun An , Jihoon Kim , Youngmin Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Cha & Reiter, LLC.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@44265e8c
- Main IPC: H04B1/28
- IPC: H04B1/28 ; H04B1/00 ; H03D7/14

Abstract:
Provided is an electronic device includes an interface for connection to an external device; and a processor electrically connected to the interface, wherein the at least one processor is configured to: set a first radio frequency (RF) signal port of a first chipset to operate in RF signal transmission mode, and set a second RF signal port of a second chipset to operate in RF signal reception mode; obtain an error of transmission performance of the first RF signal port based on a comparison between a designated transmission reference that is input to the first RF signal port and a characteristic of a first intermediate frequency (IF) signal that is output via the second RF signal port; obtain a first compensation value to enable the transmission performance of the first RF signal port to converge to the transmission reference, on the basis of the error of the transmission performance; and store at least one of the error of the transmission performance and the first compensation value in the first chipset via the interface.
Public/Granted literature
- US20190363745A1 ELECTRONIC DEVICE AND METHOD FOR TESTING WIRELESS COMMUNICATION CIRCUIT Public/Granted day:2019-11-28
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