Invention Grant
- Patent Title: Measurement apparatus, environment measurement apparatus and measurement method
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Application No.: US16244153Application Date: 2019-01-10
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Publication No.: US10724936B2Publication Date: 2020-07-28
- Inventor: Ryozo Takasu
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1b263b7e
- Main IPC: G01N15/06
- IPC: G01N15/06 ; G01N15/14 ; G01N15/00

Abstract:
A measurement apparatus includes: a measurement tank including an air inlet and an air outlet; a fan; a light source configured to irradiate micro-particulate matter with light; a photodetector configured to detect scattered light from the micro-particulate matter; a first circuit configured to detect individual particles of the micro-particulate matter based on an output of the photodetector; a second circuit configured to detect a micro-particle group of the micro-particulate matter based on the output of the photodetector; a switch configured to switch into one of a first state in which the output of the photodetector is input to the first circuit and a second state in which the output of the photodetector is input to the second circuit; and a controller configured to control a drive and stop of the fan, a turn-on and a turn-off of the light source, and a switching of a state of the switch.
Public/Granted literature
- US20190234855A1 MEASUREMENT APPARATUS, ENVIRONMENT MEASUREMENT APPARATUS AND MEASUREMENT METHOD Public/Granted day:2019-08-01
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