Invention Grant
- Patent Title: Device and method for calculating area to be out of inspection target of inspection system
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Application No.: US15926558Application Date: 2018-03-20
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Publication No.: US10724963B2Publication Date: 2020-07-28
- Inventor: Junichirou Yoshida , Fumikazu Warashina
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Hauptman Ham, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@60d3d7e8
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G06T7/00 ; B25J9/16 ; G01N21/95

Abstract:
A device capable of easily defining an area other than a surface to be inspected of a workpiece. The device includes a drawing acquisition section for acquiring drawing data of the workpiece; a designation reception section for receiving specification of the surface to be inspected of the workpiece in the drawing data; and a non-inspection area calculation section for calculating, as a non-inspection area, an image area other than the surface to be inspected in an image in a view of the imaging section when the workpiece and the imaging section are positioned at an imaging position at which at least a part of the surface to be inspected as specified falls within the view of the imaging section.
Public/Granted literature
- US20180275073A1 DEVICE AND METHOD FOR CALCULATING AREA TO BE OUT OF INSPECTION TARGET OF INSPECTION SYSTEM Public/Granted day:2018-09-27
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