Invention Grant
- Patent Title: Automatic analysis device, automatic analysis system, and automatic analysis method
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Application No.: US15749197Application Date: 2016-06-28
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Publication No.: US10725028B2Publication Date: 2020-07-28
- Inventor: Toshiyuki Inabe , Akihisa Makino , Sakuichiro Adachi , Chie Yabutani
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1d903e8c
- International Application: PCT/JP2016/069171 WO 20160628
- International Announcement: WO2017/033562 WO 20170302
- Main IPC: G01N33/48
- IPC: G01N33/48 ; G01N33/542 ; G01N21/82 ; G01N21/51 ; G01N21/25 ; G01N21/27 ; G01N33/52 ; G01N33/86 ; G01N35/00 ; G06G7/58

Abstract:
The automatic analysis device is provided with (1) a measurement mechanism having a light measuring unit having a reaction container in which the sample is dispensed, a light source which emits light to the reaction container, and a detection unit that detects scattered light from the sample in the reaction container, (2) an amplifier circuit unit having an adder-subtractor that adds or subtracts a correction signal to or from a first measurement signal from the detection unit, and an amplifier circuit which amplifies the output signal by the adder-subtractor at a fixed amplification rate to output a second measurement signal, and (3) an arithmetic operation unit which calculates the correction signal on the basis of a difference between the signal level of the second measurement signal and a target value, and which executes an analysis action based on the second measurement signal after correction by means of the correction signal.
Public/Granted literature
- US20180231537A1 AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC ANALYSIS METHOD Public/Granted day:2018-08-16
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