• Patent Title: Addressable test chip with sensing circuit
  • Application No.: US16377471
    Application Date: 2019-04-08
  • Publication No.: US10725102B2
    Publication Date: 2020-07-28
  • Inventor: Fan Lan
  • Applicant: Semitronix Corporation
  • Applicant Address: CN Hangzhou
  • Assignee: Semitronix Corporation
  • Current Assignee: Semitronix Corporation
  • Current Assignee Address: CN Hangzhou
  • Agency: Syncoda LLC
  • Agent Feng Ma
  • Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7c390520 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4f9b3b com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6632c68b
  • Main IPC: G01R31/317
  • IPC: G01R31/317 G01R31/28
Addressable test chip with sensing circuit
Abstract:
An address register includes a plurality of edge-triggered flip-flop registers having an input D, an input R, an input CK, and an output Q; a counter logic; a shifter logic; a multiplexer; input ports including a reset signal RST, a clock signal CLK, a shift enable signal SE, a shift data input signal SI; an output port including address signals ADDR. D is coupled to a data output of the multiplexer; R is coupled to a reset (RST) pad; CK is coupled to a clock (CLK) pad; Q is coupled to an address (ADDR) pad; an input of the counter logic is coupled to ADDR; an input of the shifter logic is coupled to ADDR and the shift data input signal SI; an input of the multiplexer is coupled to SE, an output of the counter logic, and an output of the shifter logic.
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