Invention Grant
- Patent Title: Addressable test chip with sensing circuit
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Application No.: US16377471Application Date: 2019-04-08
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Publication No.: US10725102B2Publication Date: 2020-07-28
- Inventor: Fan Lan
- Applicant: Semitronix Corporation
- Applicant Address: CN Hangzhou
- Assignee: Semitronix Corporation
- Current Assignee: Semitronix Corporation
- Current Assignee Address: CN Hangzhou
- Agency: Syncoda LLC
- Agent Feng Ma
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7c390520 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4f9b3b com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6632c68b
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G01R31/28

Abstract:
An address register includes a plurality of edge-triggered flip-flop registers having an input D, an input R, an input CK, and an output Q; a counter logic; a shifter logic; a multiplexer; input ports including a reset signal RST, a clock signal CLK, a shift enable signal SE, a shift data input signal SI; an output port including address signals ADDR. D is coupled to a data output of the multiplexer; R is coupled to a reset (RST) pad; CK is coupled to a clock (CLK) pad; Q is coupled to an address (ADDR) pad; an input of the counter logic is coupled to ADDR; an input of the shifter logic is coupled to ADDR and the shift data input signal SI; an input of the multiplexer is coupled to SE, an output of the counter logic, and an output of the shifter logic.
Public/Granted literature
- US20190235022A1 ADDRESSABLE TEST CHIP WITH SENSING CIRCUIT Public/Granted day:2019-08-01
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