Invention Grant
- Patent Title: Magnetic field measurement method and magnetic field measurement apparatus
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Application No.: US16260510Application Date: 2019-01-29
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Publication No.: US10725127B2Publication Date: 2020-07-28
- Inventor: Kimio Nagasaka , Mitsutoshi Miyasaka
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3633d829 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4e59fda
- Main IPC: G01R33/26
- IPC: G01R33/26 ; A61B5/04 ; G01R33/032

Abstract:
In a magnetic field measurement apparatus, a light source irradiates a gas cell with linearly polarized light serving as pump light and probe light in a Z axis direction, and a magnetic field generator applies, to the gas cell, a magnetic field Ax which is a time function f(t) having the amplitude A0 taking n fixed values fi (where i=1, . . . , and n), and a magnetic field Ay which is a time function g(t) having the amplitude A0 taking m fixed values gj (where j=1, . . . , and m) in each of X axis and Y axis directions. A calculation controller calculates a magnetic field C (Cx, Cy, Cz) of a measurement region using the X axis and Y axis components Ax and Ay of an artificial magnetic field A, and a spin polarization degree Mx corresponding to a measurement value W− from a magnetic sensor.
Public/Granted literature
- US20190154769A1 MAGNETIC FIELD MEASUREMENT METHOD AND MAGNETIC FIELD MEASUREMENT APPARATUS Public/Granted day:2019-05-23
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