Systems and methods for extended depth-of-field microscopy
Abstract:
An extended depth-of field microscope includes (a) a microdisplay having an array of emitters capable of illuminating a sample with structured illumination, (b) an image sensor for capturing an image of the sample, and a microscope objective configured to direct the structured illumination toward the sample and direct light from the sample toward the image sensor, wherein the microscope objective has tunable focal length and is object-space telecentric such that tuning of the focal length does not substantially affect magnification of either one of the image formed on the image sensor and the structured illumination projected into object space.
Public/Granted literature
Information query
Patent Agency Ranking
0/0