Invention Grant
- Patent Title: Array substrate and array substrate testing structure
-
Application No.: US15748852Application Date: 2017-12-05
-
Publication No.: US10726753B2Publication Date: 2020-07-28
- Inventor: Yao-li Huang , Xinglong He
- Applicant: Wuhan China Star Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Wuhan
- Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Wuhan
- Agency: Hemisphere Law, PLLC
- Agent Zhigang Ma
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2dcbc4a1
- International Application: PCT/CN2017/114601 WO 20171205
- International Announcement: WO2019/061815 WO 20190404
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G02F1/1362

Abstract:
An array substrate and an array substrate testing structure are provided. The array substrate includes a display region and a non-display region, a plurality of receiving test signal pins, a plurality of bonding pins and a plurality of transmission lines are positioned on the non-display region, the receiving test signal pins and the transmission lines are arranged in row. This invention decreases width of non-display region of electrical device such that easily to design the narrow frame.
Public/Granted literature
- US20190385497A1 ARRAY SUBSTRATE AND ARRAY SUBSTRATE TESTING STRUCTURE Public/Granted day:2019-12-19
Information query