Invention Grant
- Patent Title: Inspection device
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Application No.: US15377486Application Date: 2016-12-13
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Publication No.: US10726963B2Publication Date: 2020-07-28
- Inventor: Kazushige Namba , Tomonori Shichida , Naoto Kawase
- Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
- Current Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1ed86cc4
- Main IPC: G21C17/013
- IPC: G21C17/013 ; G21C17/01 ; G21C17/017

Abstract:
There is provided an inspection device for inspecting an inner surface of a nozzle provided in a reactor vessel. The inspection device includes: a device frame, an inspection unit provided on the device frame, an inspection unit push-out moving mechanism for pushing out and moving the inspection unit to the inner surface of the nozzle, a rotation moving mechanism for rotating and moving the inspection unit, a calibration test unit arranged on the device frame for calibrating the inspection unit; and a calibration test unit forward/backward moving mechanism for moving the calibration test unit forward or backward in the direction along the central axis with regard to a track where the inspection unit makes push-out movement.
Public/Granted literature
- US20180005714A1 INSPECTION DEVICE Public/Granted day:2018-01-04
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