Invention Grant
- Patent Title: Photovoltaic power generation system inspection apparatus and inspection method
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Application No.: US15786732Application Date: 2017-10-18
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Publication No.: US10727357B2Publication Date: 2020-07-28
- Inventor: Tsuyoshi Takeuchi , Akihiko Sano , Kohei Tomita
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto-shi
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto-shi
- Agency: Metrolex IP Law Group, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6d554936
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/40 ; H01L31/02 ; H01L31/0443 ; H02S50/10 ; H02S50/00
Abstract:
A defect number determination unit determines whether or not a solar cell string is defective in a plurality of positions on the basis of whether or not a combined impedance found from impedances in the case where an inspection signal is applied to a P terminal and an N terminal of the solar cell string deviates from a reference impedance by greater than or equal to a predetermined threshold.
Public/Granted literature
- US20180166589A1 PHOTOVOLTAIC POWER GENERATION SYSTEM INSPECTION APPARATUS AND INSPECTION METHOD Public/Granted day:2018-06-14
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