Invention Grant
- Patent Title: Particle imaging device and particle imaging method
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Application No.: US15267663Application Date: 2016-09-16
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Publication No.: US10732095B2Publication Date: 2020-08-04
- Inventor: Masaya Okada , Shigeki Iwanaga
- Applicant: Sysmex Corporation
- Applicant Address: JP Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Hyogo
- Agency: Brinks Gilson & Lione
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1cb56468
- Main IPC: G01N21/05
- IPC: G01N21/05 ; G01N15/14 ; G01N21/64 ; G01N15/00 ; G01N15/10

Abstract:
A particle imaging device comprises a flow cell, a light source, an irradiation optical system configured to form a light sheet on the flow cell, a light collecting optical system and an imaging element. The sheet surface of the light sheet is perpendicular to the exterior side surface of the flow cell to which the light is entered from the light source. The sheet surface of the light sheet is inclined at a predetermined angle that is not perpendicular to the flow direction of the sample.
Public/Granted literature
- US20170082531A1 PARTICLE IMAGING DEVICE AND PARTICLE IMAGING METHOD Public/Granted day:2017-03-23
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