Invention Grant
- Patent Title: Optical test apparatus and optical test method
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Application No.: US16111335Application Date: 2018-08-24
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Publication No.: US10732102B2Publication Date: 2020-08-04
- Inventor: Hiroshi Ohno , Hiroya Kano , Hideaki Okano
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@36232bbe
- Main IPC: G01N21/45
- IPC: G01N21/45 ; G01M11/02 ; G01B11/14 ; G01N21/41 ; G01N21/47

Abstract:
According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.
Public/Granted literature
- US20190219501A1 OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD Public/Granted day:2019-07-18
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