Invention Grant
- Patent Title: Method for in-line measurement of quality of microarray
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Application No.: US15896079Application Date: 2018-02-14
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Publication No.: US10732166B2Publication Date: 2020-08-04
- Inventor: Tzu-Kun Ku , Yao-Kuang Chung , Yu-Chen Wang , Po-Yen Liu
- Applicant: Centrillion Technologies Taiwan Co. LTD.
- Applicant Address: TW Hsinchu County
- Assignee: Centrillion Technologies Taiwan Co. LTD.
- Current Assignee: Centrillion Technologies Taiwan Co. LTD.
- Current Assignee Address: TW Hsinchu County
- Agency: JCIPRNET
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; G01N33/483 ; G01Q60/24 ; G01Q60/36 ; G01Q60/34

Abstract:
A method for in-line measurement of the quality of a microarray are disclosed and the method includes the following steps. A solid substrate is provided, and the solid substrate includes a plurality of areas in an array. At least one biomarker is in-situ synthesized on at least one of the plurality of areas by a plurality of synthesis steps. After performing at least one of the plurality of synthesis step, a check step is immediately performed on a semi-product of the at least one biomarker by an atomic force microscope to obtain an in-line measurement result. The quality of the semi-product of the at least one biomarker is determined based on the in-line measurement result.
Public/Granted literature
- US20180238855A1 METHOD FOR IN-LINE MEASUREMENT OF QUALITY OF MICROARRAY Public/Granted day:2018-08-23
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