Invention Grant
- Patent Title: Live metrology of an object during manufacturing or other operations
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Application No.: US15663397Application Date: 2017-07-28
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Publication No.: US10732284B2Publication Date: 2020-08-04
- Inventor: Liam Antonio Wingert , Chris A. Cantrell , Anthony W. Baker , Kenneth Paul Bowers, III , James A. Grossnickle
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Sage Patent Group
- Main IPC: G01S17/00
- IPC: G01S17/00 ; G01S17/89 ; G01B11/245 ; G06T7/30 ; G01B11/24 ; G06T7/521 ; G06T7/00 ; G06T7/60 ; G06T17/20 ; G01B11/25

Abstract:
A method for live metrology of an object includes performing a scanning operation by a plurality of sensors to collect electronic images of an object. The electronic images include 3-D point cloud data for live metrology of the object and the point cloud data from each sensor define a point cloud that represents the object. The method also includes stitching the point clouds from the plurality of sensors to generate a reconstructed model of an as-manufactured object. The method further includes comparing the reconstructed model of the as-manufactured object to an as-designed model of the object to determine that the object is manufactured within an allowable tolerance to the as-designed model of the object.
Public/Granted literature
- US20190033461A1 LIVE METROLOGY OF AN OBJECT DURING MANUFACTURING OR OTHER OPERATIONS Public/Granted day:2019-01-31
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