Invention Grant
- Patent Title: Radiation grating detector and X-ray inspection apparatus
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Application No.: US15922223Application Date: 2018-03-15
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Publication No.: US10732302B2Publication Date: 2020-08-04
- Inventor: Satoshi Sano , Junichi Ohi
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto-shi, Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto-shi, Kyoto
- Agency: Muir Patent Law, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@118fec81
- Main IPC: G01T1/20
- IPC: G01T1/20 ; A61B6/00 ; G01N23/046 ; G01N23/20
Abstract:
The radiation grating detector includes a grating portion constituting at least a second grating among a first grating, the second grating, and a third grating, and a detection portion configured to detect an incident radiation transmitted through the grating portion.
Public/Granted literature
- US20180267175A1 RADIATION GRATING DETECTOR AND X-RAY INSPECTION APPARATUS Public/Granted day:2018-09-20
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