Invention Grant
- Patent Title: Machine health monitoring, failure detection and prediction using non-parametric data
-
Application No.: US15705683Application Date: 2017-09-15
-
Publication No.: US10732618B2Publication Date: 2020-08-04
- Inventor: Fuxiao Xin , Abhinav Saxena , Jianbo Yang , Achalesh Pandey
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: Buckley, Maschoff & Talwalkar LLC
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G06K9/00 ; G05B13/02 ; G06K9/62 ; G05B17/02

Abstract:
According to some embodiments, system and methods are provided, comprising receiving, at a machine health module, non-parametric data associated with operation of an installed product; generating, via the machine health module, a health status for at least one of a failure type and a remaining useful life of the installed product, based on the received non-parametric data; and generating an operating response of the installed product based on the generated health status. Numerous other aspects are provided.
Public/Granted literature
- US20190086911A1 MACHINE HEALTH MONITORING, FAILURE DETECTION AND PREDICTION USING NON-PARAMETRIC DATA Public/Granted day:2019-03-21
Information query