Invention Grant
- Patent Title: Methods and systems for generating a combined metric parameter for A/B testing
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Application No.: US15997231Application Date: 2018-06-04
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Publication No.: US10733086B2Publication Date: 2020-08-04
- Inventor: Evgeny Vyacheslavovich Kharitonov , Aleksey Valyerevich Drutsa , Pavel Viktorovich Serdyukov
- Applicant: YANDEX EUROPE AG
- Applicant Address: CH Lucerne
- Assignee: YANDEX EUROPE AG
- Current Assignee: YANDEX EUROPE AG
- Current Assignee Address: CH Lucerne
- Agency: BCF LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@470a4a4e
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/36

Abstract:
Methods and systems for generating a combined metric parameter for A/B testing comprising: acquiring a respective first metric parameter for a first and second plurality of feature vectors, a combination of the respective first metric parameters being indicative of a direction of a change in user interactions between the control version and the treatment version, acquiring a respective second metric parameter for the first and second plurality of feature vectors, a combination of the respective second metric parameters being indicative of a magnitude of the change in user interactions between the control and treatment version, generating a respective combined control metric parameter for the first plurality of feature vectors and the second plurality of feature vectors, the combination of the respective combined metric parameters being simultaneously indicative of the magnitude and the direction of the change in user interactions between the control and treatment version.
Public/Granted literature
- US20180349258A1 METHODS AND SYSTEMS FOR GENERATING A COMBINED METRIC PARAMETER FOR A/B TESTING Public/Granted day:2018-12-06
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