Invention Grant
- Patent Title: Reconstructor and contrastor for anomaly detection
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Application No.: US15983342Application Date: 2018-05-18
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Publication No.: US10733722B2Publication Date: 2020-08-04
- Inventor: Alexandru Niculescu-Mizil , Eric Cosatto , Felix Wu
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: JP
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP
- Agent Joseph Kolodka
- Main IPC: G06T7/00
- IPC: G06T7/00 ; H04N19/132 ; H04N19/17 ; G16H50/70 ; G16H50/20 ; G06T11/20 ; G16H20/30 ; G16H30/40 ; G06T11/00

Abstract:
Systems and methods for detecting and correcting defective products include capturing at least one image of a product with at least one image sensor to generate an original image of the product. An encoder encodes portions of an image extracted from the original image to generate feature space vectors. A decoder decodes the feature space vectors to reconstruct the portions of the image into reconstructed portions by predicting defect-free structural features in each of the portions according to hidden layers trained to predict defect-free products. Each of the reconstructed portions are merged into a reconstructed image of a defect-free representation of the product. The reconstructed image is communicated to a contrastor to detect anomalies indicating defects in the product.
Public/Granted literature
- US20180374207A1 RECONSTRUCTOR AND CONTRASTOR FOR ANOMALY DETECTION Public/Granted day:2018-12-27
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