- Patent Title: System and method for improving x-ray production in an x-ray device
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Application No.: US15847047Application Date: 2017-12-19
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Publication No.: US10734186B2Publication Date: 2020-08-04
- Inventor: Michael William Gorrilla
- Applicant: GENERAL ELECTRIC COMPANY
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: Grogan, Tuccillo & Vanderleeden, LLP
- Main IPC: H01J35/10
- IPC: H01J35/10 ; H01J35/12 ; H01J35/08

Abstract:
An x-ray device is presented. The x-ray device includes a cathode configured to emit an electron beam. Also, the x-ray device includes an anode configured to rotate about a longitudinal axis of the x-ray device and positioned to receive the emitted electron beam, where the anode includes a target element disposed on an anode surface of the anode and a track element embedded in the target element, where the track element is configured to generate x-rays in response to the emitted electron beam impinging on a focal spot on the track element, where at least a portion of the track element is configured to transition from a first phase to a second phase based on heat generated in at least a portion of the track element, and where at least the portion of the track element is configured to distribute the generated heat across the anode.
Public/Granted literature
- US20190189386A1 SYSTEM AND METHOD FOR IMPROVING X-RAY PRODUCTION IN AN X-RAY DEVICE Public/Granted day:2019-06-20
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