Invention Grant
- Patent Title: Semiconductor device and manufacturing method for semiconductor device
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Application No.: US16113907Application Date: 2018-08-27
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Publication No.: US10734494B2Publication Date: 2020-08-04
- Inventor: Hirokazu Fujimaki , Koichi Kaneko
- Applicant: LAPIS Semiconductor Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee Address: JP Yokohama
- Agency: Rabin & Berdo, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1cbb7d46
- Main IPC: H01L29/15
- IPC: H01L29/15 ; H01L29/423 ; H01L27/12 ; H01L29/417 ; H01L29/20 ; H01L29/16 ; H01L29/786 ; H01L29/778

Abstract:
A semiconductor device includes insulating substrate; a compound semiconductor layer provided in a first region of a surface of the insulating substrate; and a silicon layer provided in a second region, differing from the first region, of the surface of the insulating substrate. The semiconductor device further includes: a first gate electrode provided on a surface of the compound semiconductor layer; a pair of conductive members provided at positions on the surface of the compound semiconductor layer to sandwich the first gate electrode between the pair of conductive members; a second gate electrode provided on a surface of the silicon layer; and a pair of diffusion layers provided at positions in the silicon layer to sandwich the second gate electrode between the pair of diffusion layers. One of the conductive members is electrically connected to one of the diffusion layers.
Public/Granted literature
- US20190067432A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE Public/Granted day:2019-02-28
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