According to one embodiment, an electronic circuit includes a plurality of first transistors, a control circuit, a sample hold circuit and a calculation circuit. The control circuit selectively performs a first operation and a second operation, the first operation supplying a driving control signal to a gate terminal of a semiconductor switching element using the plurality of first transistors, and the second operation supplying a pulse current for measurement to the gate terminal using part of the plurality of first transistors. The sample hold circuit samples a voltage of the gate terminal during a period in which the pulse current is supplied to the gate terminal in the second operation. The calculation circuit calculates a gate resistance of the semiconductor switching element based on the sampled voltage.