Invention Grant
- Patent Title: Method for measuring frequency offset between an RF transmitter and a test receiver
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Application No.: US16552596Application Date: 2019-08-27
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Publication No.: US10735036B1Publication Date: 2020-08-04
- Inventor: Jan Verspecht , Troels Studsgaard Nielsen
- Applicant: Keysight Technologies, Inc.
- Applicant Address: US CA Santa Rosa
- Assignee: Keysight Technologies, Inc.
- Current Assignee: Keysight Technologies, Inc.
- Current Assignee Address: US CA Santa Rosa
- Main IPC: H04B1/04
- IPC: H04B1/04 ; H04B1/16 ; H04B17/21 ; H04L27/26 ; H03D7/14 ; H03L7/00 ; H04B17/00 ; H04L27/28

Abstract:
A method for operating a data processing system to determine the actual frequency of a transmitter LO in a transmitter that up converts a repetitive input time domain signal to a repetitive RF signal is disclosed. The method includes receiving a repetitive RF signal resulting from up converting the input time domain signal and assuming a value for the transmitter LO frequency. The received signal is down converted to an IF signal using the transmitter LO frequency, and digitizes to form a time domain record, The time domain record is converted to a sequence of frequency spectra, each frequency spectrum is characterized by a time index and a plurality of plurality of phasors. The frequency difference between the assumed LO transmitter and an actual LO transmitter frequency is determined by fitting the sequence of frequency spectra to a phase tracker function of the time index and the frequency difference.
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