Invention Grant
- Patent Title: Method and system to enhance accuracy and resolution of system integrated scope using calibration data
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Application No.: US16050929Application Date: 2018-07-31
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Publication No.: US10735115B2Publication Date: 2020-08-04
- Inventor: Gernot Hueber , Ian Thomas Macnamara
- Applicant: NXP B.V.
- Applicant Address: US CA San Jose
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: US CA San Jose
- Main IPC: H04B17/21
- IPC: H04B17/21 ; G01R31/28 ; G06F7/48 ; G06F7/544 ; H03M1/10 ; H04B1/00

Abstract:
This specification discloses methods and systems for implementing a chip integrated scope (i.e., chip scope (CS)), which is a feature that allows a user to scope RF signals (internally and externally to the DUT (device under test)), by using the RF receive path (including amplifier, filter, ADC, DSP) to capture and store signal traces. In some embodiments, this specification discloses methods and systems to enhance the resolution and accuracy of these signal traces by using raw and correction data for gain/phase compensation of gain/phase impairments introduced in the Rx (receiver) path. In some embodiments, the correction data is generated from one or more of the following: simulation data, characterization data, production test data.
Public/Granted literature
- US20200044754A1 METHOD AND SYSTEM TO ENHANCE ACCURACY AND RESOLUTION OF SYSTEM INTEGRATED SCOPE USING CALIBRATION DATA Public/Granted day:2020-02-06
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