- Patent Title: Eye diagram measurement device and eye diagram measurement method
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Application No.: US16408486Application Date: 2019-05-10
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Publication No.: US10735149B2Publication Date: 2020-08-04
- Inventor: Wen-Juh Kang , Yu-Chu Chen , Hsun-Wei Kao
- Applicant: GLOBAL UNICHIP CORPORATION , TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu TW Hsinchu
- Assignee: GLOBAL UNICHIP CORPORATION,TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: GLOBAL UNICHIP CORPORATION,TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu TW Hsinchu
- Agency: CKC & Partners Co., LLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@782605da
- Main IPC: H04L1/24
- IPC: H04L1/24 ; G01R31/3185 ; G01R31/319 ; H04L1/20

Abstract:
An eye diagram measurement device includes a first mapping circuitry, a count circuitry, a second mapping circuitry and a memory circuitry. The first mapping circuitry maps one of plurality of internal signals of an electronic device to a first data signal having a predetermined number of bits. The counter circuitry performs a counting operation according to the first data signal and a plurality of signal values associated with the predetermined number of bits, to generate a plurality of count signals. The second mapping circuitry maps the count signals respectively to a plurality of eye diagram measurement signals corresponding to a present phase. The memory circuitry stores the eye diagram measurement signals in order to provide the eye diagram measurement signals to an external system for generating an eye diagram measurement result of the electronic device.
Public/Granted literature
- US20200014501A1 EYE DIAGRAM MEASUREMENT DEVICE AND EYE DIAGRAM MEASUREMENT METHOD Public/Granted day:2020-01-09
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