Invention Grant
- Patent Title: Autonomously-controlled inspection platform with model-based active adaptive data collection
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Application No.: US15872582Application Date: 2018-01-16
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Publication No.: US10739770B2Publication Date: 2020-08-11
- Inventor: Huan Tan , Ana Dasilva , Eric Gros , Romano Patrick , Charles Theurer , Mauricio Castillo-Effen , John Lizzi
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: G05D1/02
- IPC: G05D1/02 ; G01M1/00 ; B64C39/02 ; G05D1/00

Abstract:
Modifying a motion plan for an autonomously-operated inspection platform (AIP) includes obtaining sensor data for an industrial asset area of interest, analyzing the obtained sensor data during execution of an initial motion plan to determine if modification of the initial motion plan is required. If modification is required then performing a pose estimation on a first group of potential targets and a second group of potential targets, optimizing the results of the pose estimation to determine a modification to the initial motion plan, performing reactive planning to the initial motion plan to include the modification, the reactive planning providing a modified motion plan that includes a series of waypoints defining a modified path, and autonomously controlling motion of the AIP along the modified path. The analysis, pose estimation, optimization, and reactive planning occurring during movement of the AIP along a motion plan. A system and computer-readable medium are disclosed.
Public/Granted literature
- US20190220019A1 AUTONOMOUSLY-CONTROLLED INSPECTION PLATFORM WITH MODEL-BASED ACTIVE ADAPTIVE DATA COLLECTION Public/Granted day:2019-07-18
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